CHARACTERIZATION OF IN-BASED EUTECTIC ALLOYS USED IN JOSEPHSON PACKAGING

被引:15
作者
YEH, JTC
机构
来源
METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 1982年 / 13卷 / 09期
关键词
D O I
10.1007/BF02644794
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1547 / 1562
页数:16
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共 13 条
[1]   VIBRATING REED INTERNAL-FRICTION APPARATUS FOR FILMS AND FOILS [J].
BERRY, BS ;
PRITCHET, WC .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1975, 19 (04) :334-343
[2]   OVERVIEW OF JOSEPHSON PACKAGING [J].
BROWN, AV .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (02) :167-171
[3]   SEEMAN-BOHLIN X-RAY DIFFRACTOMETER FOR THIN FILMS [J].
FEDER, R ;
BERRY, BS .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 (OCT1) :372-&
[4]  
GREBE KR, 1980, J ELECTROCHEM SOC, V127, pC86
[5]  
ROUSH W, 1978, COMMUNICATION
[6]  
SMITH JF, 1974, MATER ENG, V80, P76
[7]   CONTROLLED COLLAPSE REFLOW FOR JOSEPHSON CHIP BONDING [J].
TING, CY ;
GREBE, K ;
WALDMAN, D .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (04) :859-864
[8]  
TING CY, 1979, COMMUNICATION
[9]  
WALDMAN D, 1979, UNPUB
[10]  
WELEFF W, 1965, ADVANCES CRYOGENIC E, V10, P50