SCANNING TUNNELING MICROSCOPY OF DECAGONAL AND ICOSAHEDRAL QUASI-CRYSTALS

被引：24

作者：

BECKER, RS

KORTAN, AR

THIEL, FA

CHEN, HS

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 02期

关键词：

D O I：

10.1116/1.585485

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The scanning tunneling microscope is used under ultrahigh vacuum conditions to image the clean surfaces of decagonal Al65Co20Cu15 and icosahedral Al65Cu20Fe15. The tunneling images show nonperiodic surfaces whose features are adequately described by pentagonal quasilattice for the case of the decagonal material, suggesting that a tiling model accounts for the surface features. The scanning tunneling microscope measurements of the scale of surface features is in good agreement with high resolution x-ray diffraction measurements of the bulk.

引用

页码：867 / 873

页数：7

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