INSITU RUTHERFORD BACKSCATTERING MEASUREMENTS OF ION-BEAM-INDUCED ATOMIC MIXING

被引:5
作者
JORCH, HH
WERNER, RD
机构
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期
关键词
D O I
10.1016/0167-5087(83)91069-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:703 / 706
页数:4
相关论文
共 5 条
  • [1] CRYOGENIC SYSTEM FOR LOW-TEMPERATURE AND CLEAN-ENVIRONMENT CHANNELING MEASUREMENTS
    BOTTIGER, J
    DAVIES, JA
    LORI, J
    WHITTON, JL
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1973, 109 (03): : 579 - 583
  • [2] JORCH HH, UNPUB
  • [3] ION-BEAM MIXING OF METAL-SEMICONDUCTOR EUTECTIC SYSTEMS
    LAU, SS
    TSAUR, BY
    VONALLMEN, M
    MAYER, JW
    STRITZKER, B
    WHITE, CW
    APPLETON, B
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR): : 97 - 105
  • [4] MAYER JW, 1981, P NATO S SURFACE MOD
  • [5] TSAUR BY, 1980, THIN FILM INTERFACES, V802, P205