ANODIC SYNTHESIS OF CDS FILMS

[1] MEASUREMENT OF THICKNESS AND REFRACTIVE INDEX OF OXIDE FILMS ON SILICON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1962, 109 (12) : 1206 - 1212

[2] GRUSS LL, 1963, ELECTROCHEM TECHNOL, V1, P283

[3] The Electron Flow in Insulators at extremities of Field Strengths [J]. ZEITSCHRIFT FUR PHYSIK, 1934, 91 (1-2): : 70 - 96

[4] Studies on the Sparks of electrolytic Valve Effect [J]. ZEITSCHRIFT FUR PHYSIK, 1937, 107 (03): : 347 - 353

[5] GUNTHERSCHULZE A, 1908, ANN PHYS, V26, P372

[6] ON THE PREPARATION OF HARD OXIDE FILMS WITH PRECISELY CONTROLLED THICKNESS ON EVAPORATED ALUMINUM MIRRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 532 - 540

[7] JAENICKE W, 1955, Z ELEKTROCHEM, V59, P448

[8] POWDERLY JE, AF336166203 RES PUR

[9] THE KINETICS OF FORMATION AND STRUCTURE OF ANODIC OXIDE FILMS ON TANTALUM [J]. ACTA METALLURGICA, 1953, 1 (03): : 282 - &

[10] Young L, 1961, ANODIC OXIDE FILMS

[1] MEASUREMENT OF THICKNESS AND REFRACTIVE INDEX OF OXIDE FILMS ON SILICON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1962, 109 (12) : 1206 - 1212

[2] GRUSS LL, 1963, ELECTROCHEM TECHNOL, V1, P283

[3] The Electron Flow in Insulators at extremities of Field Strengths [J]. ZEITSCHRIFT FUR PHYSIK, 1934, 91 (1-2): : 70 - 96

[4] Studies on the Sparks of electrolytic Valve Effect [J]. ZEITSCHRIFT FUR PHYSIK, 1937, 107 (03): : 347 - 353

[5] GUNTHERSCHULZE A, 1908, ANN PHYS, V26, P372

[6] ON THE PREPARATION OF HARD OXIDE FILMS WITH PRECISELY CONTROLLED THICKNESS ON EVAPORATED ALUMINUM MIRRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 532 - 540

[7] JAENICKE W, 1955, Z ELEKTROCHEM, V59, P448

[8] POWDERLY JE, AF336166203 RES PUR

[9] THE KINETICS OF FORMATION AND STRUCTURE OF ANODIC OXIDE FILMS ON TANTALUM [J]. ACTA METALLURGICA, 1953, 1 (03): : 282 - &

[10] Young L, 1961, ANODIC OXIDE FILMS