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CORRECTION METHOD FOR DETERMINING THE OPTICAL-CONSTANTS OF THIN-FILMS WITH NON-UNIFORM THICKNESS

被引：4
作者：
TOROK, MI
MICHAILOVITS, L
HEVESI, I
机构：
来源：
THIN SOLID FILMS | 1984年 / 116卷 / 1-3期
关键词：
D O I：
10.1016/0040-6090(84)90440-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：235 / 239
页数：5
相关论文
共 6 条
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HEVESI, I .
ACTA PHYSICA ACADEMIAE SCIENTIARUM HUNGARICAE, 1967, 23 (01) :75-&
[2]  
Lyashenko S P, 1964, OPT SPEKTROSK, V16, P80
[3]   SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM [J].
MANIFACIER, JC ;
GASIOT, J ;
FILLARD, JP .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11) :1002-1004
[4]   DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF AMORPHOUS V2O5 THIN-FILMS [J].
MICHAILOVITS, L ;
HEVESI, I ;
PHAN, L ;
VARGA, Z .
THIN SOLID FILMS, 1983, 102 (01) :71-76
[5]  
Torok M. I., 1983, Acta Universitatis Szegediensis, Acta Physica et Chemica, V29, P103
[6]  
Valeev A., 1963, OPT SPEKTROSK, V15, P269
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