ORIGIN OF 1/F NOISE IN Y1BA2CU3O7-X STEP-EDGE DC SQUIDS

被引：21

作者：

GRUNDLER, D ^{[1
]}

ECKART, R ^{[1
]}

DAVID, B ^{[1
]}

DOSSEL, O ^{[1
]}

机构：

[1] PHILIPS GMBH,TECH SYST ABT,VOGT KOLLN STR 30,W-2000 HAMBURG 54,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1993年 / 62卷 / 17期

关键词：

D O I：

10.1063/1.109450

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have fabricated Y1Ba2Cu3O7-x step-edge junction de superconducting quantum interference devices (SQUIDs) and characterized their noise performance. The current-voltage characteristics of our SQUIDs are of resistively shunted junction type with critical current densities J(c) of about 10(4) A/cm2 and maximum flux to voltage transfer functions deltaV/deltaPHI of 20 muV/PHI0 at 77 K. We compare model predictions for 1/f noise in dc SQUIDs with experimental data and show that the frequency dependent noise in our devices results from critical current fluctuations of the Josephson junctions. A bias current reversing technique is effective in suppressing this noise contribution. A flux noise PHI(n) of 80 muPHI0/Hz1/2 at 1 Hz and 77 K was measured on a dc SQUID with an inductance L(s) of 60 pH.

引用

页码：2134 / 2136

页数：3

共 15 条

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