THERMOELECTRIC THIN-FILM HIGH-TEMPERATURE MEASUREMENTS BY COMPUTER CONTROL

被引：5

作者：

ROBERTS, SS

RABINOVICH, SM

SHING, YH

TRAN, NT

JOSEFOWICZ, JY

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1986年 / 57卷 / 02期

关键词：

D O I：

10.1063/1.1138930

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：276 / 284

页数：9

共 14 条

[1]

BENSON DK, 1982, P POWER SOURCES S, V30, P238

[2]

CARDOFF IB, 1960, THERMOELECTRIC MATER

[3] THIN-FILM THERMAL DEVICE APPLICATIONS [J].

CHOPRA, KL ;

PANDYA, DK .

THIN SOLID FILMS, 1978, 50 (MAY) :81-98

[4]

JAYADEV TS, 1979, 6TH P OC THERM EN CO, V1, P9

[5]

JOSEFOWICZ JY, UNPUB

[6]

ROWE DM, 1978, P IEEE, V125, pR11

[7] SPUTTERED BI2TE3 AND PBTE THIN-FILMS [J].

SHING, YH ;

CHANG, Y ;

MIRSHAFII, A ;

HAYASHI, L ;

ROBERTS, SS ;

JOSEFOWICZ, JY ;

TRAN, N .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02) :503-506

[8]

SUGE Y, 1958, AOKI OYO BUTSURI, V27, P769

[9] GETE THIN-FILMS - AMORPHOUS AND CRYSTALLINE CHARACTERISTICS [J].

TRAN, NT ;

CHANG, YC ;

FARAGALLI, DA ;

ROBERTS, SS ;

JOSEFOWICZ, JY ;

SHING, YH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02) :345-347

[10] THERMOELECTRIC PROPERTIES OF AMORPHOUS ANTIMONY [J].

TREFNY, JU ;

PETERS, DS ;

FOX, JN .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1984, 65 (2-3) :215-222

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