MICROINDENTATIONS ON W AND MO ORIENTED SINGLE-CRYSTALS - AN STM STUDY

被引：577

作者：

STELMASHENKO, NA ^{[1
]}

WALLS, MG ^{[1
]}

BROWN, LM ^{[1
]}

MILMAN, YV ^{[1
]}

机构：

[1] KIEV MAT SCI INST, KIEV 252142, UKRAINE

来源：

ACTA METALLURGICA ET MATERIALIA | 1993年 / 41卷 / 10期

关键词：

D O I：

10.1016/0956-7151(93)90100-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Indentations of micron size into the (100), (110) and (111) surfaces of Mo and W single crystals have been studied using the scanning tunneling microscopy (STM). Results on geometrical parameters of indents are presented and discussed in connection with the mechanism of plastic flow and the indentation size effect.

引用

页码：2855 / 2865

页数：11

共 10 条

[1] BROWN LS, UNPUB
[2] Bulychev S. I., 1979, Fizika i Khimiya Obrabotki Materialov, P69
[3] Calladine CR, 1969, ENG PLASTICITY
[4] IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY
CASTELL, MR
WALLS, MG
HOWIE, A
[J]. ULTRAMICROSCOPY, 1992, 42 : 1490 - 1497
[5] LOCAL LATTICE ROTATIONS AT 2ND PHASE PARTICLES IN DEFORMED METALS
HUMPHREYS, FJ
[J]. ACTA METALLURGICA, 1979, 27 (12): : 1801 - 1814
[6] Lanin A. G., 1989, Metallofizika, V11, P41
[7] MCCOLM IJ, 1990, CERAMIC HARDNESS
[8] STELMASHENKO NA, 1993, MECHANICAL PROPERTIE
[9] ELASTIC RECOVERY OF CONICAL INDENTATIONS
STILWELL, NA
TABOR, D
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1961, 78 (500): : 169 - &
[10] STM PROFILOMETRY OF LOW-LOAD VICKERS INDENTATIONS IN A SILICON CRYSTAL
WALLS, MG
CHAUDHRI, MM
TANG, TB
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1992, 25 (03) : 500 - 507

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