USX AND SX RADIATION MEASUREMENT OF TOKAMAK PLASMA BY MICROCHANNEL PLATE

被引：9

作者：

KALVIN, S

BAKOS, JS

BURGER, G

KARDON, B

PETRAVICH, G

ZOLETNIK, S

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 09期

关键词：

D O I：

10.1063/1.1140617

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2857 / 2860

页数：4

共 7 条

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REUSCH, M ;

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[2] THE SOFT-X-RAY QUANTUM DETECTION EFFICIENCY OF MICROCHANNEL PLATES [J].

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[3]

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[4] VACUUM ULTRAVIOLET AND ULTRASOFT X-RAY DIODE DETECTORS FOR TOKAMAK PLASMAS [J].

LEE, P ;

GERNHARDT, J ;

ARMENTROUT, CJ ;

SNIDER, RT .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) :883-888

[5] STUDIES OF INTERNAL DISRUPTIONS AND M = 1 OSCILLATIONS IN TOKAMAK DISCHARGES WITH SOFT-X-RAY TECHNIQUES [J].

VONGOELER, S ;

STODIEK, W ;

SAUTHOFF, N .

PHYSICAL REVIEW LETTERS, 1974, 33 (20) :1201-1203

[6]

WIZA JL, 1979, NUCL INSTRUM METHODS, V162, P587, DOI 10.1016/0029-554X(79)90734-1

[7]

ZOLETNIK S, 1988, KFKI198864D REP

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