LATTICE-PARAMETER STUDY IN THE BI1-XSBX SOLID-SOLUTION SYSTEM

被引:30
作者
BERGER, H
CHRIST, B
TROSCHKE, J
机构
关键词
D O I
10.1002/crat.2170171010
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:1233 / 1239
页数:7
相关论文
共 13 条
[1]   X-RAY WAVELENGTHS [J].
BEARDEN, JA .
REVIEWS OF MODERN PHYSICS, 1967, 39 (01) :78-&
[2]   INVESTIGATION OF CHEMICAL MICRO-INHOMOGENEITIES IN BI100-XSBX SINGLE-CRYSTALS [J].
BERGER, H ;
KUHRIG, B ;
OELGART, G ;
PIETSCH, U ;
SCHIKORA, D .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 52 (02) :427-432
[3]  
BERGER H, UNPUB
[4]  
BRANDT NB, 1976, ZH EKSP TEOR FIZ+, V43, P1198
[5]  
CHRIST B, 1981, CRYST RES TECHNOL, V16, P623
[6]   CRYSTAL STRUCTURE OF BI AND OF SOLID SOLUTIONS OF PB, SN, SB AND TE IN BI [J].
CUCKA, P ;
BARRETT, CS .
ACTA CRYSTALLOGRAPHICA, 1962, 15 (SEP) :865-&
[7]   CYCLOTRON MASSES IN SEMICONDUCTING BI1-XSBX ALLOYS [J].
OELGART, G ;
HERRMANN, R .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1976, 75 (01) :189-196
[8]   THE VALIDITY OF VEGARD RULE FOR THE SOLID-SOLUTION SYSTEM BI1-XSBX [J].
PIETSCH, U .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1982, 110 (01) :K5-K9
[9]   CRYSTAL STRUCTURE OF ARSENIC AT 4.2-DEGREES K 78-DEGREES K AND 299 DEGREES K [J].
SCHIFERL, D ;
BARRETT, CS .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :30-&
[10]   OPTIMIZATION OF CRYSTALLIZATION PARAMETERS IN ZONE MELTS FROM TEMPERATURE-FIELD CALCULATIONS [J].
SCHIKORA, D ;
SCHAFER, P ;
ERBEN, N .
KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1978, 13 (07) :781-789