DEPOSITION AND CHARACTERIZATION OF FULLERENE FILMS

Thermal sublimation of pure C60 and C70 has been used for depositing well-characterized fullerene films on a variety of substrates. Film purity is determined by infrared absorption spectra and the extent of crystallinity of the face-centered cubic structure by x rays. Thickness-dependent optical and electrical measurements reveal uniform films over the thickness range 200-1000 angstrom. We obtain optical absorption coefficients having values between those of Si and Ge and a relative permittivity having a value close to that of amorphous SiO2.