PULSED-LASER TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE

被引：91

作者：

TSONG, TT

MCLANE, SB

KINKUS, TJ

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1982年 / 53卷 / 09期

关键词：

D O I：

10.1063/1.1137193

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1442 / 1448

页数：7

共 19 条

[1] APPLICATION OF FIELD-ION MICROSCOPY TECHNIQUES TO METALLURGICAL PROBLEMS [J].

BRENNER, SS .

SURFACE SCIENCE, 1978, 70 (01) :427-451

[2] PHOTON-INDUCED FIELD-IONIZATION MASS-SPECTROSCOPY [J].

DRACHSEL, W ;

NISHIGAKI, S ;

BLOCK, JH .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 32 (04) :333-343

[3]

ERNST N, 1981, 28TH P INT FIELD EM

[4] APPLICATION OF HIGH-FIELD SURFACE ANALYTICAL TECHNIQUES TO THE STUDY OF PLASMA-WALL INTERACTIONS IN PLT [J].

KELLOGG, GL ;

PANITZ, JA .

APPLIED SURFACE SCIENCE, 1979, 3 (01) :13-37

[5] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY [J].

KELLOGG, GL ;

TSONG, TT .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) :1184-1193

[6] PREMATURE FIELD EVAPORATION IN ATOM PROBE [J].

KRISHNASWAMY, SV ;

MULLER, EW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (09) :1049-1052

[7]

Liu H., UNPUB

[8]

Miller M. K., 1979, Surface and Interface Analysis, V1, P149, DOI 10.1002/sia.740010504

[9] ATOM-PROBE FIELD ION MICROSCOPE [J].

MULLER, EW ;

PANITZ, JA ;

MCLANE, SB .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) :83-&

[10] ENERGY DEFICITS IN PULSED FIELD EVAPORATION AND DEFICIT COMPENSATED ATOM-PROBE DESIGNS [J].

MULLER, EW ;

KRISHNASWAMY, SV .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (09) :1053-1059

← 1 2 →