LOCAL-STRUCTURE OF NI2SI

[1] ELECTRONIC PROPERTIES OF SILICON-TRANSITION METAL INTERFACE COMPOUNDS [J]. SURFACE SCIENCE REPORTS, 1985, 4 (5-6) : 271 - 364

[2] CALANDRA C, 1981, J PHYS C, V14, P5479

[3] LOCAL-STRUCTURE DETERMINATION OF THE CO-SI(111) INTERFACE BY SURFACE ELECTRON ENERGY-LOSS FINE-STRUCTURE TECHNIQUE [J]. SURFACE SCIENCE, 1986, 168 (1-3) : 801 - 809

[4] COMIN F, 1983, PHYS REV LETT, V51, P2002

[5] X-RAY ABSORPTION NEAR-EDGE STRUCTURE AND EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATION OF PD SILICIDES [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 612 - 622

[6] EXTENDED ELS FINE-STRUCTURES ABOVE THE M2,3 EDGES OF CU AND NI [J]. SOLID STATE COMMUNICATIONS, 1981, 40 (05) : 613 - 617

[7] XPS STUDY OF THE CHEMICAL-STRUCTURE OF THE NICKEL-SILICON INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 924 - 929

[8] LEE PA, 1981, REV MOD PHYS, V53, P671

[9] PRACTICAL METHOD FOR FULL CURVED-WAVE THEORY ANALYSIS OF EXPERIMENTAL EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J]. PHYSICAL REVIEW B, 1986, 33 (02): : 841 - 846

[10] MOTTA N, 1983, PHYS REV B, V27, P1712

[1] ELECTRONIC PROPERTIES OF SILICON-TRANSITION METAL INTERFACE COMPOUNDS [J]. SURFACE SCIENCE REPORTS, 1985, 4 (5-6) : 271 - 364

[2] CALANDRA C, 1981, J PHYS C, V14, P5479

[3] LOCAL-STRUCTURE DETERMINATION OF THE CO-SI(111) INTERFACE BY SURFACE ELECTRON ENERGY-LOSS FINE-STRUCTURE TECHNIQUE [J]. SURFACE SCIENCE, 1986, 168 (1-3) : 801 - 809

[4] COMIN F, 1983, PHYS REV LETT, V51, P2002

[5] X-RAY ABSORPTION NEAR-EDGE STRUCTURE AND EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATION OF PD SILICIDES [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 612 - 622

[6] EXTENDED ELS FINE-STRUCTURES ABOVE THE M2,3 EDGES OF CU AND NI [J]. SOLID STATE COMMUNICATIONS, 1981, 40 (05) : 613 - 617

[7] XPS STUDY OF THE CHEMICAL-STRUCTURE OF THE NICKEL-SILICON INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 924 - 929

[8] LEE PA, 1981, REV MOD PHYS, V53, P671

[9] PRACTICAL METHOD FOR FULL CURVED-WAVE THEORY ANALYSIS OF EXPERIMENTAL EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J]. PHYSICAL REVIEW B, 1986, 33 (02): : 841 - 846

[10] MOTTA N, 1983, PHYS REV B, V27, P1712