LOCAL-STRUCTURE DETERMINATION OF THE CO-SI(111) INTERFACE BY SURFACE ELECTRON ENERGY-LOSS FINE-STRUCTURE TECHNIQUE

被引:44
作者
CHAINET, E
DECRESCENZI, M
DERRIEN, J
NGUYEN, TTA
CINTI, RC
机构
关键词
D O I
10.1016/0039-6028(86)90912-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
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页码:801 / 809
页数:9
相关论文
共 15 条
[1]   TRANSITION-METAL SILICIDES - ASPECTS OF THE CHEMICAL-BOND AND TRENDS IN THE ELECTRONIC-STRUCTURE [J].
BISI, O ;
CALANDRA, C .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (35) :5479-5494
[2]  
CAMPAGNA M, COMMUNICATION
[3]  
CHAINET E, 1985, PHYS REV B, V31, P7469, DOI 10.1103/PhysRevB.31.7469
[4]  
CHAINET E, UNPUB
[5]   STRUCTURE AND NUCLEATION MECHANISM OF NICKEL SILICIDE ON SI(111) DERIVED FROM SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE [J].
COMIN, F ;
ROWE, JE ;
CITRIN, PH .
PHYSICAL REVIEW LETTERS, 1983, 51 (26) :2402-2405
[6]   EXTENDED ELS FINE-STRUCTURES ABOVE THE M2,3 EDGES OF CU AND NI [J].
DECRESCENZI, M ;
PAPAGNO, L ;
CHIARELLO, G ;
SCARMOZZINO, R ;
COLAVITA, E ;
ROSEI, R .
SOLID STATE COMMUNICATIONS, 1981, 40 (05) :613-617
[7]   SURFACE EXTENDED ENERGY-LOSS FINE-STRUCTURES OF OXYGEN ON NI(100) [J].
DECRESCENZI, M ;
ANTONANGELI, F ;
BELLINI, C ;
ROSEI, R .
PHYSICAL REVIEW LETTERS, 1983, 50 (24) :1949-1952
[8]   STRUCTURAL AND ELECTRONIC-PROPERTIES OF COSI2 EPITAXIALLY GROWN ON SI(111) [J].
DERRIEN, J .
SURFACE SCIENCE, 1986, 168 (1-3) :171-183
[9]   EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL [J].
LEE, PA ;
CITRIN, PH ;
EISENBERGER, P ;
KINCAID, BM .
REVIEWS OF MODERN PHYSICS, 1981, 53 (04) :769-806
[10]   COBALT DISILICIDE EPITAXIAL-GROWTH ON THE SILICON (111) SURFACE [J].
PIRRI, C ;
PERUCHETTI, JC ;
GEWINNER, G ;
DERRIEN, J .
PHYSICAL REVIEW B, 1984, 29 (06) :3391-3397