DETERMINATION OF THE ABSOLUTE STRUCTURE FACTOR FOR THE FORBIDDEN (222) REFLECTION IN SILICON USING 0.12-A GAMMA-RAYS

被引：44

作者：

ALKIRE, RW

YELON, WB

SCHNEIDER, JR

机构：

[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH,D-1000 BERLIN 39,FED REP GER

[2] UNIV MISSOURI,COLUMBIA,MO 65211

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.26.3097

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：3097 / 3104

页数：8

相关论文

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