QUANTITATIVE TEXTURE MEASUREMENTS ON EVAPORATED FILMS

被引:4
作者
WITT, F
VOOK, RW
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10.1063/1.1703069
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O59 [应用物理学];
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页码:3686 / &
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[2]   PREFERRED ORIENTATION DETERMINATION USING A GEIGER COUNTER X-RAY DIFFRACTION GONIOMETER [J].
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[5]   STRUCTURE AND ANNEALING BEHAVIOR OF METAL FILMS DEPOSITED ON SUBSTRATES NEAR 80 DEGREES K .2. GOLD FILMS ON GLASS [J].
VOOK, RW ;
WITT, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1965, 2 (05) :243-&