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VLSI YIELD PREDICTION AND ESTIMATION - A UNIFIED FRAMEWORK

被引：60
作者：
MALY, W
STROJWAS, AJ
DIRECTOR, SW
机构：
[1] Carnegie-Mellon Univ, Pittsburgh,, PA, USA, Carnegie-Mellon Univ, Pittsburgh, PA, USA
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1986年 / 5卷 / 01期
关键词：
D O I：
10.1109/TCAD.1986.1270182
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
INTEGRATED CIRCUIT MANUFACTURE
引用
收藏
页码：114 / 130
页数：17
相关论文
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