ELECTRICAL PROPERTIES OF CARRIER GENERATION-RECOMBINATION CENTERS IN SILICON P-N JUNCTIONS

被引:6
作者
SATO, S
KAWAJI, S
机构
关键词
D O I
10.1063/1.1713946
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3779 / +
页数:1
相关论文
共 9 条
[1]   PROPERTIES OF GOLD-DOPED SILICON [J].
COLLINS, CB ;
CARLSON, RO ;
GALLAGHER, CJ .
PHYSICAL REVIEW, 1957, 105 (04) :1168-1173
[2]  
RUPPRECHT G, 1963, ANN NY ACAD SCI, V101, P960
[4]  
RUPPRECHT G, 1960, P INT C SEMICONDUCTO, P282
[5]   CARRIER GENERATION AND RECOMBINATION IN P-N JUNCTIONS AND P-N JUNCTION CHARACTERISTICS [J].
SAH, CT ;
NOYCE, RN ;
SHOCKLEY, W .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (09) :1228-1243
[6]  
SAH CT, 1962, IRE T ELECTRON DEV, VED9, P94, DOI DOI 10.1109/T-ED.1962.14895
[7]  
SATO S, 1964, JPN J APPL PHYS, V3, P496
[8]   STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS [J].
SHOCKLEY, W ;
READ, WT .
PHYSICAL REVIEW, 1952, 87 (05) :835-842
[9]   THE THEORY OF P-N JUNCTIONS IN SEMICONDUCTORS AND P-N JUNCTION TRANSISTORS [J].
SHOCKLEY, W .
BELL SYSTEM TECHNICAL JOURNAL, 1949, 28 (03) :435-489