SELECTION OF A LASER RELIABILITY ASSURANCE STRATEGY FOR A LONG-LIFE APPLICATION

被引:16
作者
NASH, FR [1 ]
JOYCE, WB [1 ]
HARTMAN, RL [1 ]
GORDON, EI [1 ]
DIXON, RW [1 ]
机构
[1] LYTEL INC,SOMMERVILLE,NJ 07974
来源
AT&T TECHNICAL JOURNAL | 1985年 / 64卷 / 03期
关键词
D O I
10.1002/j.1538-7305.1985.tb00445.x
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:671 / 715
页数:45
相关论文
共 77 条
[1]   PROCEDURES FOR SELECTION OF SEMICONDUCTOR DIODES FOR USE IN UNDERSEA CABLE SYSTEMS [J].
ABRAHAMSON, IG ;
SLUTSKY, EB ;
LEE, ET .
IEEE TRANSACTIONS ON RELIABILITY, 1972, R 21 (04) :200-+
[2]   PREMATURE FAILURE IN PT-GAAS IMPATTS - RECOMBINATION-ASSISTED DIFFUSION AS A FAILURE MECHANISM [J].
BALLAMY, WC ;
KIMERLING, LC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (06) :746-752
[3]  
Barlow R. E., 1965, MATH THEORY RELIABIL, P9
[4]  
BARLOW RE, 1975, STATISTICAL THEORY R, P52
[5]  
BAZOVSKY I, 1961, RELIABILITY THEORY P, P32
[6]  
CARHART RR, 1953, RM1131 RAND CORP RES, P1
[7]  
DELOACH BC, 1973, IEEE P, V61, P1042
[8]  
EARLES DR, 1963, 9TH NAT S REL QUAL C, P43
[9]   A STATISTICAL APPROACH TO LASER CERTIFICATION [J].
ECKLER, AR .
AT&T TECHNICAL JOURNAL, 1985, 64 (03) :765-770
[10]   RAPID DEGRADATION OF INGAASP/INP DOUBLE HETEROSTRUCTURE LASERS DUE TO 110 DARK LINE DEFECT FORMATION [J].
ENDO, K ;
MATSUMOTO, S ;
KAWANO, H ;
SAKUMA, I ;
KAMEJIMA, T .
APPLIED PHYSICS LETTERS, 1982, 40 (11) :921-923