OPTICAL NONLINEARITY OF CDSE MICROCRYSTALLITES IN A SPUTTERED SIO2 FILM

被引:33
作者
YUMOTO, J
SHINOJIMA, H
UESUGI, N
TSUNETOMO, K
NASU, H
OSAKA, Y
机构
[1] HIROSHIMA UNIV, FAC ENGN, DEPT ELECT ENGN, HIROSHIMA 724, JAPAN
[2] MIE UNIV, FAC ENGN, DEPT IND CHEM, TSU, MIE 514, JAPAN
关键词
D O I
10.1063/1.104176
中图分类号
O59 [应用物理学];
学科分类号
摘要
Optical nonlinearity of a sputtered SiO2 film containing CdSe microcrystallites with an average diameter of 15 Å is measured by degenerate four-wave mixing (DFWM) experiments. An effective nonlinear cross section σeff of 1.4×10-16 cm2 is obtained. The DFWM signal as a function of the probe delay time shows biexponential behavior with a fast decay time of 10 ps and a slow decay time of 60 ps, which give fast and slow carrier recombination times as 20 ps and 120 ps. The third-order susceptibility ∥χ(3)∥ is estimated to be 1.3×10-8 esu. The photodarkening and laser annealing effects which are serious problems for device applications are not observed.
引用
收藏
页码:2393 / 2395
页数:3
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