LOW-TEMPERATURE CHEMICAL-VAPOR-DEPOSITION PROCESSES AND DIELECTRICS FOR MICROELECTRONIC CIRCUIT MANUFACTURING AT IBM

被引:26
作者
COTE, DR
NGUYEN, SV
COTE, WJ
PENNINGTON, SL
STAMPER, AK
PODLESNIK, DV
机构
[1] IBM CORP, DIV MICROELECTR, BURLINGTON FACIL, ESSEX JCT, VT 05452 USA
[2] APPL MAT INC, SANTA CLARA, CA 95054 USA
关键词
D O I
10.1147/rd.394.0437
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Significant progress has been made over the past decade in low-temperature plasma-enhanced and thermal chemical vapor deposition (CVD), The progress has occurred in response to the high demands placed on the insulators of multilevel microelectronic circuits because of the continuing reduction in circuit dimensions. High-aspect-ratio gap filling is foremost among these demands, which also include Tower processing temperatures and improved dielectric planarization. This paper reviews the history of interlevel and intermetal dielectrics used in microelectronic circuit manufacturing at IBM and the current status of processes used in IBM manufacturing and development lines, and describes the challenges for future memory and logic chip applications.
引用
收藏
页码:437 / 464
页数:28
相关论文
共 140 条
[51]  
KAANTA CW, 1991, 8TH P VLSI MULT INT, P144
[52]  
KANICKI J, 1987, ELECTROCHEM SOC P, V87, P261
[53]  
KATO T, 1993 S VLSI TECHN, P153
[54]  
KENNEY D, 1992 S VLSI TECHN, P14
[55]   CHEMICAL VAPOR DEPOSITION OF SILICATE GLASSES FOR USE WITH SILICON DEVICES .1. DEPOSITION TECHNIQUES [J].
KERN, W ;
HEIM, R .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (04) :562-&
[56]  
KERN W, 1973, RCA REV, V34, P655
[57]  
KIEWRA E, 1994, 11TH P INT VLSI MULT, P359
[58]   A METHOD FOR THE DEPOSITION OF SIO AT LOW TEMPERATURES [J].
KLERER, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (11) :1070-1071
[59]   SPUTTER-ETCHING PLANARIZATION FOR MULTILEVEL METALLIZATION [J].
KOTANI, H ;
YAKUSHIJI, H ;
HARADA, H ;
TSUKAMOTO, K ;
NISHIOKA, T .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) :645-648
[60]  
KOUVETAKIS J, 1990, J VAC SCI TECHNOL A, V8, P3928, DOI 10.1116/1.576423