STEM-HOLOGRAPHY USING THE ELECTRON BIPRISM

被引:25
作者
LEUTHNER, T
LICHTE, H
HERRMANN, KH
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 116卷 / 01期
关键词
D O I
10.1002/pssa.2211160111
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:113 / 121
页数:9
相关论文
共 11 条
[1]   IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J].
COWLEY, JM .
APPLIED PHYSICS LETTERS, 1969, 15 (02) :58-&
[2]  
DABERKOW I, 1988, 9TH P EUR C EL MICR, V1, P125
[3]  
DEKKERS NH, 1974, OPTIK, V41, P452
[4]   A NEW MICROSCOPIC PRINCIPLE [J].
GABOR, D .
NATURE, 1948, 161 (4098) :777-778
[5]  
HAIDER M, 1988, 9TH P EUR C EL MICR, V1, P123
[6]  
LEUTHNER T, IN PRESS
[7]  
LOCHTE H, 1988, PHYSICA B, V151, P214
[8]   BEOBACHTUNGEN UND MESSUNGEN AN BIPRISMA-INTERFERENZEN MIT ELEKTRONENWELLEN [J].
MOLLENSTEDT, G ;
DUKER, H .
ZEITSCHRIFT FUR PHYSIK, 1956, 145 (03) :377-397
[9]  
MORRISON GR, 1983, OPTIK, V64, P1
[10]  
ROSE H, 1974, OPTIK, V39, P416