INVESTIGATION OF DIFFUSION LENGTH AND LIFETIME IN LEAD CHALCOGENIDES BY ELECTRON-BEAM-INDUCED-CURRENT MEASUREMENTS AT LOW-TEMPERATURES

被引：6

作者：

EISENBEISS, A ^{[1
]}

HEINRICH, H ^{[1
]}

JAKUBOWICZ, A ^{[1
]}

MAURER, W ^{[1
]}

PALMETSHOFER, L ^{[1
]}

PREIER, HM ^{[1
]}

BACHEM, KH ^{[1
]}

BOTTNER, H ^{[1
]}

机构：

[1] FRAUNHOFER INST PHYS MESSTECH, D-7800 FREIBURG, FED REP GER

来源：

JOURNAL OF APPLIED PHYSICS | 1984年 / 56卷 / 02期

关键词：

D O I：

10.1063/1.333973

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：362 / 367

页数：6

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