ELECTRON INTERFEROMETRY FROM VOIDS IN SPINEL

被引：3

作者：

DECOOMAN, BC

CARTER, CB

机构：

来源：

ULTRAMICROSCOPY | 1984年 / 13卷 / 03期

关键词：

D O I：

10.1016/0304-3991(84)90202-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：233 / 239

页数：7

共 16 条

[1] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J].

CARPENTER, RW ;

SPENCE, JCH .

ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN) :55-&

[2] IMAGE FORMATION AND CONTRAST FROM CONVERGENT ELECTRON-BEAM [J].

DOWELL, WCT ;

GOODMAN, P .

PHILOSOPHICAL MAGAZINE, 1973, 28 (02) :471-473

[3]

DOWELL WCT, 1977, OPTIK, V47, P195

[4]

Durelli AJ, 1970, MOIRE ANAL STRAIN

[5] FRESNEL FRINGE CONTRAST OF FACETED VOIDS WITHIN GEM-QUALITY DIAMOND [J].

HUTCHISON, JL ;

BURSILL, LA .

JOURNAL OF MICROSCOPY-OXFORD, 1983, 131 (JUL) :63-66

[6] A COMPARISON OF TECHNIQUES FOR OBTAINING CONVERGENT BEAM ELECTRON-DIFFRACTION PATTERNS WITH A JEOL-200CX [J].

LEE, KC .

ULTRAMICROSCOPY, 1982, 10 (03) :217-222

[7] AN ELECTRON INTERFEROMETER [J].

MARTON, L ;

SIMPSON, JA ;

SUDDETH, JA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1954, 25 (11) :1099-1104

[8] APPLICATION OF TRANSMISSION ELECTRON-MICROSCOPY TO THE STUDY OF DEFORMATION IN CERAMIC OXIDES [J].

MITCHELL, TE .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1979, 62 (5-6) :254-267

[9]

OSTYN K, COMMUNICATION

[10]

RACKHAM GM, 1978, I PHYS C SER, V41, P435

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