DEPENDENCE OF THE VACUUM SUBLIMATION RATE OF CDTE UPON CRYSTALLOGRAPHIC ORIENTATION

被引:20
作者
DUBOWSKI, JJ [1 ]
WROBEL, JM [1 ]
WILLIAMS, DF [1 ]
机构
[1] MICROELECTR TECHNOL OFF,INFORMAT TECHNOL IND BRANCH,OTTAWA K1A 0H5,ONTARIO,CANADA
关键词
D O I
10.1063/1.99843
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:660 / 662
页数:3
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