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CARRIER LEAKAGE AND TEMPERATURE-DEPENDENCE OF INGAASP LASERS
被引:38
作者
:
CHEN, TR
论文数:
0
引用数:
0
h-index:
0
CHEN, TR
CHANG, B
论文数:
0
引用数:
0
h-index:
0
CHANG, B
CHIU, LC
论文数:
0
引用数:
0
h-index:
0
CHIU, LC
YU, KL
论文数:
0
引用数:
0
h-index:
0
YU, KL
MARGALIT, S
论文数:
0
引用数:
0
h-index:
0
MARGALIT, S
YARIV, A
论文数:
0
引用数:
0
h-index:
0
YARIV, A
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1983年
/ 43卷
/ 03期
关键词
:
D O I
:
10.1063/1.94305
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:217 / 218
页数:2
相关论文
共 6 条
[1]
Chen T., UNPUB
[2]
DIRECT MEASUREMENT OF THE CARRIER LEAKAGE IN AN INGAASP INP LASER
CHEN, TR
论文数:
0
引用数:
0
h-index:
0
CHEN, TR
MARGALIT, S
论文数:
0
引用数:
0
h-index:
0
MARGALIT, S
KOREN, U
论文数:
0
引用数:
0
h-index:
0
KOREN, U
YU, KL
论文数:
0
引用数:
0
h-index:
0
YU, KL
CHIU, LC
论文数:
0
引用数:
0
h-index:
0
CHIU, LC
HASSON, A
论文数:
0
引用数:
0
h-index:
0
HASSON, A
YARIV, A
论文数:
0
引用数:
0
h-index:
0
YARIV, A
[J].
APPLIED PHYSICS LETTERS,
1983,
42
(12)
: 1000
-
1002
[3]
CHIU LC, 1983, IEEE J QUANTUM ELECT, V19
[4]
TEMPERATURE-DEPENDENCE OF THRESHOLD AND ELECTRICAL CHARACTERISTICS OF INGAASP-INP DH LASERS
DUTTA, NK
论文数:
0
引用数:
0
h-index:
0
DUTTA, NK
NELSON, RJ
论文数:
0
引用数:
0
h-index:
0
NELSON, RJ
BARNES, PA
论文数:
0
引用数:
0
h-index:
0
BARNES, PA
[J].
ELECTRONICS LETTERS,
1980,
16
(17)
: 653
-
654
[5]
HENSHALL GD, 1982, IEEE SEMICONDUCTOR L
[6]
EVIDENCE FOR AUGER AND FREE-CARRIER LOSSES IN GAINASP-INP LASERS - SPECTROSCOPY OF A SHORT WAVELENGTH EMISSION
MOZER, A
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
MOZER, A
ROMANEK, KM
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
ROMANEK, KM
SCHMID, W
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
SCHMID, W
PILKUHN, MH
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
PILKUHN, MH
SCHLOSSER, E
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
SCHLOSSER, E
[J].
APPLIED PHYSICS LETTERS,
1982,
41
(10)
: 964
-
966
←
1
→
共 6 条
[1]
Chen T., UNPUB
[2]
DIRECT MEASUREMENT OF THE CARRIER LEAKAGE IN AN INGAASP INP LASER
CHEN, TR
论文数:
0
引用数:
0
h-index:
0
CHEN, TR
MARGALIT, S
论文数:
0
引用数:
0
h-index:
0
MARGALIT, S
KOREN, U
论文数:
0
引用数:
0
h-index:
0
KOREN, U
YU, KL
论文数:
0
引用数:
0
h-index:
0
YU, KL
CHIU, LC
论文数:
0
引用数:
0
h-index:
0
CHIU, LC
HASSON, A
论文数:
0
引用数:
0
h-index:
0
HASSON, A
YARIV, A
论文数:
0
引用数:
0
h-index:
0
YARIV, A
[J].
APPLIED PHYSICS LETTERS,
1983,
42
(12)
: 1000
-
1002
[3]
CHIU LC, 1983, IEEE J QUANTUM ELECT, V19
[4]
TEMPERATURE-DEPENDENCE OF THRESHOLD AND ELECTRICAL CHARACTERISTICS OF INGAASP-INP DH LASERS
DUTTA, NK
论文数:
0
引用数:
0
h-index:
0
DUTTA, NK
NELSON, RJ
论文数:
0
引用数:
0
h-index:
0
NELSON, RJ
BARNES, PA
论文数:
0
引用数:
0
h-index:
0
BARNES, PA
[J].
ELECTRONICS LETTERS,
1980,
16
(17)
: 653
-
654
[5]
HENSHALL GD, 1982, IEEE SEMICONDUCTOR L
[6]
EVIDENCE FOR AUGER AND FREE-CARRIER LOSSES IN GAINASP-INP LASERS - SPECTROSCOPY OF A SHORT WAVELENGTH EMISSION
MOZER, A
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
MOZER, A
ROMANEK, KM
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
ROMANEK, KM
SCHMID, W
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
SCHMID, W
PILKUHN, MH
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
PILKUHN, MH
SCHLOSSER, E
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
AEG TELEFUNKEN,FORSCHUNGSINST,D-7900 ULM,FED REP GER
SCHLOSSER, E
[J].
APPLIED PHYSICS LETTERS,
1982,
41
(10)
: 964
-
966
←
1
→