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THE DETERMINATION OF SILICON IN DEIONIZED PROCESS WATER BY GRAPHITE-FURNACE AAS
被引:12
作者
:
FEHSE, F
论文数:
0
引用数:
0
h-index:
0
FEHSE, F
机构
:
来源
:
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
|
1984年
/ 39卷
/ 04期
关键词
:
D O I
:
10.1016/0584-8547(84)80067-1
中图分类号
:
O433 [光谱学];
学科分类号
:
0703 ;
070302 ;
摘要
:
引用
收藏
页码:597 / 598
页数:2
相关论文
共 6 条
[1]
HILL RW, 1982, CHEM BRIT, V18, P872
[2]
LIDDELL PR, 1982, INT LAB, V12, P62
[3]
METHOD FOR IMPROVING THE DETERMINATION OF SILICON BY ATOMIC-ABSORPTION SPECTROMETRY USING A TANTALUM-COATED CARBON FURNACE
LYTHGOE, DJ
论文数:
0
引用数:
0
h-index:
0
LYTHGOE, DJ
[J].
ANALYST,
1981,
106
(1264)
: 743
-
750
[4]
RAWA JA, 1979, ANAL CHEM, V51, P452, DOI 10.1021/ac50039a031
[5]
ROUTH MW, 1982, AM LAB, V14, P80
[6]
Sheaffer J. D., 1978, ANAL CHEM, V50, P1239
←
1
→
共 6 条
[1]
HILL RW, 1982, CHEM BRIT, V18, P872
[2]
LIDDELL PR, 1982, INT LAB, V12, P62
[3]
METHOD FOR IMPROVING THE DETERMINATION OF SILICON BY ATOMIC-ABSORPTION SPECTROMETRY USING A TANTALUM-COATED CARBON FURNACE
LYTHGOE, DJ
论文数:
0
引用数:
0
h-index:
0
LYTHGOE, DJ
[J].
ANALYST,
1981,
106
(1264)
: 743
-
750
[4]
RAWA JA, 1979, ANAL CHEM, V51, P452, DOI 10.1021/ac50039a031
[5]
ROUTH MW, 1982, AM LAB, V14, P80
[6]
Sheaffer J. D., 1978, ANAL CHEM, V50, P1239
←
1
→