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IMPURITY AND CONCENTRATION-DEPENDENCE OF GROWTH-RATE DURING SOLID EPITAXY OF IMPLANTED SI
被引:11
作者
:
CAMPISANO, SU
论文数:
0
引用数:
0
h-index:
0
CAMPISANO, SU
机构
:
来源
:
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
|
1982年
/ 29卷
/ 03期
关键词
:
D O I
:
10.1007/BF00617771
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:147 / 149
页数:3
相关论文
共 15 条
[11]
PAULING L, 1978, NATURE CHEM BOND, P179
[12]
SERVIDORI M, UNPUB
[13]
X-RAY ROCKING CURVE STUDY OF SI-IMPLANTED GAAS, SI, AND GE
[J].
SPERIOSU, VS
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
SPERIOSU, VS
;
PAINE, BM
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
PAINE, BM
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
NICOLET, MA
;
GLASS, HL
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
GLASS, HL
.
APPLIED PHYSICS LETTERS,
1982,
40
(07)
:604
-606
[14]
COMPENSATING IMPURITY EFFECT ON EPITAXIAL REGROWTH RATE OF AMORPHIZED SI
[J].
SUNI, I
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SUNI, I
;
GOLTZ, G
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
GOLTZ, G
;
GRIMALDI, MG
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
GRIMALDI, MG
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NICOLET, MA
;
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
LAU, SS
.
APPLIED PHYSICS LETTERS,
1982,
40
(03)
:269
-271
[15]
SUBSTITUTIONAL SOLID SOLUBILITY LIMITS DURING SOLID-PHASE EPITAXY OF ION-IMPLANTED (100) SILICON
[J].
WILLIAMS, JS
论文数:
0
引用数:
0
h-index:
0
WILLIAMS, JS
;
ELLIMAN, RG
论文数:
0
引用数:
0
h-index:
0
ELLIMAN, RG
.
APPLIED PHYSICS LETTERS,
1982,
40
(03)
:266
-268
←
1
2
→
共 15 条
[11]
PAULING L, 1978, NATURE CHEM BOND, P179
[12]
SERVIDORI M, UNPUB
[13]
X-RAY ROCKING CURVE STUDY OF SI-IMPLANTED GAAS, SI, AND GE
[J].
SPERIOSU, VS
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
SPERIOSU, VS
;
PAINE, BM
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
PAINE, BM
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
NICOLET, MA
;
GLASS, HL
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
ROCKWELL INT,CTR MICROELECTR RES & DEV,ANAHEIM,CA 92803
GLASS, HL
.
APPLIED PHYSICS LETTERS,
1982,
40
(07)
:604
-606
[14]
COMPENSATING IMPURITY EFFECT ON EPITAXIAL REGROWTH RATE OF AMORPHIZED SI
[J].
SUNI, I
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SUNI, I
;
GOLTZ, G
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
GOLTZ, G
;
GRIMALDI, MG
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
GRIMALDI, MG
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NICOLET, MA
;
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
LAU, SS
.
APPLIED PHYSICS LETTERS,
1982,
40
(03)
:269
-271
[15]
SUBSTITUTIONAL SOLID SOLUBILITY LIMITS DURING SOLID-PHASE EPITAXY OF ION-IMPLANTED (100) SILICON
[J].
WILLIAMS, JS
论文数:
0
引用数:
0
h-index:
0
WILLIAMS, JS
;
ELLIMAN, RG
论文数:
0
引用数:
0
h-index:
0
ELLIMAN, RG
.
APPLIED PHYSICS LETTERS,
1982,
40
(03)
:266
-268
←
1
2
→