KINEMATICAL ANALYSIS OF RHEED PATTERNS FROM A HYDROGEN ADSORBED SI(111) DELTA-7 X 7 SURFACE

被引:13
作者
HORIO, Y
ICHIMIYA, A
KOHMOTO, S
NAKAHARA, H
机构
[1] Nagoya Univ, Nagoya, Japan
关键词
D O I
10.1016/0039-6028(91)90789-U
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A Si(111)delta-7 x 7 surface appears by the adsorption of hydrogen atoms or some alkaline metals etc. on the clean Si(111)7 x 7 surface at room temperature. In this paper, hydrogen adsorbed delta-7 x 7 RHEED patterns have been kinematically analyzed based on the dimer-adatom-stacking fault (DAS) structure taking account of a change of the bonding state of the Si adatoms induced by hydrogen adsorption. Intensities of the experimental RHEED patterns agree well with the calculated ones for a model with randomly distributed SiH3 clusters on the dimer-stacking fault (DSF) framework, which preserves the periodicity of the delta-7 x 7 RHEED pattern.
引用
收藏
页码:167 / 174
页数:8
相关论文
共 31 条
[1]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[2]  
CHABAL YJ, 1983, PHYS REV LETT, V51, P801
[3]   HYDROGEN ADSORPTION ON SI(111)-(7X7) [J].
CULBERTSON, RJ ;
FELDMAN, LC ;
SILVERMAN, PJ ;
HAIGHT, R .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03) :868-871
[4]   STUDY OF THE SI(111) 7X7 SURFACE-STRUCTURE BY ALKALI-METAL ADSORPTION [J].
DAIMON, H ;
INO, S .
SURFACE SCIENCE, 1985, 164 (01) :320-326
[5]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[6]   ADSORPTION STATES AND ADSORPTION-KINETICS OF ATOMIC-HYDROGEN ON SILICON CRYSTAL-SURFACES [J].
FROITZHEIM, H ;
KOHLER, U ;
LAMMERING, H .
SURFACE SCIENCE, 1985, 149 (2-3) :537-557
[7]   KINEMATICAL ANALYSIS OF RHEED INTENSITIES FROM THE SI(111)7 X 7 STRUCTURE [J].
HORIO, Y ;
ICHIMIYA, A .
SURFACE SCIENCE, 1989, 219 (1-2) :128-142
[8]   RHEED INTENSITY ANALYSIS OF SI(111)7X7 AND 3-SQUARE-ROOT X 3-SQUARE-ROOT-AG SURFACES .1. KINEMATIC DIFFRACTION APPROACH [J].
HORIO, Y ;
ICHIMIYA, A .
SURFACE SCIENCE, 1983, 133 (2-3) :393-400
[9]   RHEED INTENSITY ANALYSIS OF SI(111)7 X 7-H SURFACE [J].
ICHIMIYA, A ;
MIZUNO, S .
SURFACE SCIENCE, 1987, 191 (1-2) :L765-L771
[10]  
ICHIMIYA A, 1987, SURF SCI, V192, pL893, DOI 10.1016/S0039-6028(87)81122-6