SPECTROSCOPY IN THE EVANESCENT FIELD WITH AN ANALYTICAL PHOTON SCANNING TUNNELING MICROSCOPE

被引：16

作者：

MOYER, PJ

JAHNCKE, CL

PAESLER, MA

REDDICK, RC

WARMACK, RJ

机构：

[1] UNIV TENNESSEE,DEPT PHYS & ASTRON,KNOXVILLE,TN 37919

[2] OAK RIDGE NATL LAB,DIV HLTH & SAFETY RES,OAK RIDGE,TN 37831

来源：

PHYSICS LETTERS A | 1990年 / 145卷 / 6-7期

关键词：

D O I：

10.1016/0375-9601(90)90946-L

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby. © 1990.

引用

页码：343 / 347

页数：5

共 5 条

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