QUANTITATIVE-ANALYSIS OF WEAK LOCALIZATION IN THIN MG FILMS BY MAGNETORESISTANCE MEASUREMENTS

被引:70
作者
BERGMANN, G
机构
来源
PHYSICAL REVIEW B | 1982年 / 25卷 / 04期
关键词
D O I
10.1103/PhysRevB.25.2937
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
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页码:2937 / 2939
页数:3
相关论文
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