NONDESTRUCTIVE METHOD FOR MEASURING COMPLEX PERMITTIVITY OF DIELECTRIC MATERIALS AT MICROWAVE-FREQUENCIES USING AN OPEN TRANSMISSION-LINE RESONATOR

被引：67

作者：

TANABE, E ^{[1
]}

JOINES, WT ^{[1
]}

机构：

[1] DUKE UNIV,DEPT ELECT ENGN,DURHAM,NC 27706

来源：

关键词：

D O I：

10.1109/TIM.1976.6312350

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：222 / 226

页数：5

共 8 条

[1] COLLIN RE, 1966, F MICROWAVE ENGINEER
[2] DECRETON MC, 1975, 1975 P IEEE MTTS INT
[3] NEW METHOD FOR MEASURING PROPERTIES OF DIELECTRIC MATERIALS USING A MICROSTRIP CAVITY
ITOH, T
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1974, MT22 (05) : 572 - 576
[4] JOINES WT, 1968, IEEE T MICROW THEORY, VMT16, P258
[5] STRIP-LINE METHODS FOR DIELECTRIC MEASUREMENTS AT MICROWAVE FREQUENCIES
OLYPHANT, M
BALL, JH
[J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1970, EI 5 (01): : 26 - &
[6] SCHWAN H P, 1957, Adv Biol Med Phys, V5, P147
[7] SUCHER M, 1963, MICROWAVE MEASUREMEN, V2, P495
[8] TANABE E, 1975, THESIS DUKE U