AUTOTUNING OF A TEM USING MINIMUM ELECTRON DOSE

被引：37

作者：

KOSTER, AJ

DERUIJTER, WJ

VANDENBOS, A

VANDERMAST, KD

机构：

来源：

ULTRAMICROSCOPY | 1989年 / 27卷 / 03期

关键词：

D O I：

10.1016/0304-3991(89)90018-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：251 / 272

页数：22

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