A POSSIBLE USE OF THE SOFT-X-RAY STANDING WAVE METHOD FOR SURFACE AND INTERFACE STRUCTURE-ANALYSIS

被引:32
作者
OHTA, T
KITAJIMA, Y
KURODA, H
TAKAHASHI, T
KIKUTA, S
机构
[1] UNIV TOKYO,FAC SCI,DEPT CHEM,7-3-1 HONGO,BUNKYO KU,TOKYO 113,JAPAN
[2] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,TOKYO 113,JAPAN
关键词
D O I
10.1016/0168-9002(86)90186-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:760 / 762
页数:3
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    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (06): : L475 - L477
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    [J]. PHYSICAL REVIEW B, 1985, 31 (10): : 6884 - 6886