NANO-INDENTATION STUDIES OF ULTRAHIGH STRENGTH CARBON NITRIDE THIN-FILMS

被引:213
作者
LI, D
CHUNG, YW
WONG, MS
SPROUL, WD
机构
[1] NORTHWESTERN UNIV, MCCORMICK SCH ENGN & APPL SCI, DEPT MAT SCI & ENGN, EVANSTON, IL 60208 USA
[2] NORTHWESTERN UNIV, BIRL IND RES LAB, EVANSTON, IL 60201 USA
[3] NORTHWESTERN UNIV, MCCORMICK SCH ENGN & APPL SCI, CTR ENGN TRIBOL, EVANSTON, IL 60208 USA
关键词
D O I
10.1063/1.355304
中图分类号
O59 [应用物理学];
学科分类号
摘要
Carbon nitride (CN(x)) thin films were prepared by dc magnetron sputtering of a graphite target in a nitrogen ambient onto Si(100) substrates held at ambient temperatures. The films are amorphous with a small volume fraction of nanocrystallites. All CN(x) coatings grown to a thickness of 1.5 mum are adherent and smooth. Nanoindentation studies showed clear dependence of hardness and effective modulus on deposition process parameters (nitrogen pressure, target power, and substrate bias). Most striking is the observation that CN(x) films can be synthesized with yield strength exceeding 5 GPa.
引用
收藏
页码:219 / 223
页数:5
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