TEST OF ANNEALED CZOCHRALSKI GROWN SILICON-CRYSTALS AS X-RAY-DIFFRACTION ELEMENTS WITH 145 KEV SYNCHROTRON RADIATION

被引：33

作者：

SCHNEIDER, JR

NAGASAWA, H

BERMAN, LE

HASTINGS, JB

SIDDONS, DP

ZULEHNER, W

机构：

[1] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE,UPTON,NY 11973

[2] WACKER CHEMITRON GMBH,D-8263 BURGHAUSEN,FED REP GER

来源：

关键词：

D O I：

10.1016/0168-9002(89)90597-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：636 / 642

页数：7

共 16 条

[11]

SCHNEIDER JR, UNPUB J APPL PHYS

[12]

SCHNEIDER JR, 1981, NUCLEAR SCI APPLICAT, V2, P227

[13]

SIDDONS DP, 1989, IN PRESS REV SCI INS

[14]

Zachariasen W. H., 1945, THEORY XRAY DIFFRACT

ZAUMSEIL, P ;

WINTER, U .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 70 (02) :497-505

ZAUMSEIL, P ;

WINTER, U .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 73 (02) :455-466