FURTHER EVIDENCE FOR THE PRESENCE OF RESIDUAL FLAWS IN A THIN OXIDE LAYER COVERING HIGH-PURITY ALUMINUM

被引：13

作者：

BROWN, GM ^{[1
]}

SHIMIZU, K ^{[1
]}

KOBAYASHI, K ^{[1
]}

THOMPSON, GE ^{[1
]}

WOOD, GC ^{[1
]}

机构：

[1] UNIV MANCHESTER,INST SCI & TECHNOL,CTR CORROS & PROTECT,MANCHESTER M60 1QD,LANCS,ENGLAND

来源：

CORROSION SCIENCE | 1993年 / 34卷 / 12期

关键词：

D O I：

10.1016/0010-938X(93)90062-L

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：2099 / &

共 8 条

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[2] THE MORPHOLOGY, STRUCTURE AND MECHANISM OF GROWTH OF CHEMICAL CONVERSION COATINGS ON ALUMINUM [J].

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WOOD, GC .

CORROSION SCIENCE, 1992, 33 (09) :1371-1385

[3]

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BURSTEIN, GT .

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[6]

Cuff B. E., 1958, J I MET, V87, P248

[7] APPLICATION OF ULTRAMICROTOMY TO ELECTRON-OPTICAL EXAMINATION OF SURFACE-FILMS ON ALUMINUM [J].

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CORROSION SCIENCE, 1978, 18 (10) :853-&

[8] A STUDY OF PITTING CORROSION OF A1 BY SCANNING ELECTRON MICROSCOPY [J].

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