COLLECTION AND ANALYSIS OF POWDER DIFFRACTION DATA WITH NEAR-CONSTANT COUNTING STATISTICS

被引:69
作者
MADSEN, IC
HILL, RJ
机构
关键词
D O I
10.1107/S0021889893008593
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The concept of a variable-counting-time (VCT) strategy for use in Rietveld analysis of X-ray powder diffraction data was introduced by Madsen & Hill [Adv. X-ray Anal. (1992), 35, 39-47]. This strategy is based on a function that increases the counting time used at each step in the scan in a manner that is inversely proportional to the decline in reflection intensity that inevitably results from the combined effects of Lp factor, scattering factor and thermal vibration. The present work extends the VCT function to include the effects of reflection multiplicity, cylindrical-sample (capillary) absorption and monochromator polarization. The new algorithm has been incorporated into a PC computer program and applied to the collection of data from samples of LaB6, tourmaline, forsterite and boehmite. Subsequent analysis of the data using the Rietveld method has shown that VCT data can produce more accurate atomic coordinates and site occupancies, lower residual 'noise' in difference Fourier maps and more stable refinement of 'light' atoms.
引用
收藏
页码:385 / 392
页数:8
相关论文
共 15 条
[1]  
[Anonymous], 1993, ELEMENTS XRAY DIFFRA
[2]  
BASSO R, 1979, N JB MINERAL MONAT, P197
[3]   CHOICE OF COLLIMATORS FOR A CRYSTAL SPECTROMETER FOR NEUTRON DIFFRACTION [J].
CAGLIOTI, G ;
PAOLETTI, A ;
RICCI, FP .
NUCLEAR INSTRUMENTS & METHODS, 1958, 3 (04) :223-228
[4]   STRUCTURE REFINEMENT OF DEUTERATED BOEHMITE [J].
CORBATO, CE ;
TETTENHORST, RT ;
CHRISTOPH, GG .
CLAYS AND CLAY MINERALS, 1985, 33 (01) :71-75
[5]  
David W. I. F., 1992, NIST SPECIAL PUBLICA, V846, P210
[6]   X-RAY DETERMINATION OF ELECTRON DISTRIBUTIONS IN FORSTERITE, FAYALITE AND TEPHROITE [J].
FUJINO, K ;
SASAKI, S ;
TAKEUCHI, Y ;
SADANAGA, R .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1981, 37 (MAR) :513-518
[7]   THE EFFECT OF PROFILE STEP WIDTH ON THE DETERMINATION OF CRYSTAL-STRUCTURE PARAMETERS AND ESTIMATED STANDARD DEVIATIONS BY X-RAY RIETVELD ANALYSIS [J].
HILL, RJ ;
MADSEN, IC .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 :10-18
[8]   RIETVELD ANALYSIS USING PARA-FOCUSING AND DEBYE-SCHERRER GEOMETRY DATA COLLECTED WITH A BRAGG-BRENTANO DIFFRACTOMETER [J].
HILL, RJ ;
MADSEN, IC .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1991, 196 (1-4) :73-92
[10]  
Hill RJ., 1987, POWDER DIFFR, V2, P146, DOI DOI 10.1017/S088571560001263X