SCHOTTKY-BARRIER MOBILITY PROFILING MEASUREMENTS WITH GATE-CURRENT CORRECTIONS

被引:6
作者
LOOK, DC
COOPER, TA
机构
[1] Wright State Univ, Univ Research, Cent, Dayton, OH, USA, Wright State Univ, Univ Research Cent, Dayton, OH, USA
关键词
SCHOTTKY-BARRIER GATE - SCHOTTKY-BARRIER MOBILITY;
D O I
10.1016/0038-1101(85)90117-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:521 / 527
页数:7
相关论文
共 13 条
[11]  
STREETMAN BG, 1980, SOLID STATE ELECTRON, P175
[12]  
WIEDER H, 1979, LABORATORY NOTES ELE
[13]   SERIES RESISTANCE EFFECTS IN SEMICONDUCTOR CV PROFILING [J].
WILEY, JD ;
MILLER, GL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (05) :265-272