EXPERIMENTAL-DETERMINATION OF THE IMAGING PROPERTIES OF A 200 KV ELECTRON-MICROSCOPE

被引：6

作者：

GLANVILL, SR

MOODIE, AF

WHITFIELD, HJ

WILSON, IJ

机构：

[1] CSIRO, Clayton, Aust, CSIRO, Clayton, Aust

来源：

AUSTRALIAN JOURNAL OF PHYSICS | 1986年 / 39卷 / 01期

关键词：

All Open Access; Bronze;

D O I：

10.1071/PH860071

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Microscopes, Electron

引用

页码：71 / 92

页数：22

共 10 条

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[5] MEASUREMENT OF THE SCATTERING FACTOR PHASE AND THE SPHERICAL AND ASTIGMATIC ABERRATION CONSTANTS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS [J].

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[6]

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[7]

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[8] N-BEAM LATTICE IMAGES .5. USE OF CHARGE-DENSITY APPROXIMATION IN INTERPRETATION OF LATTICE IMAGES [J].

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[9]

SMITH DJ, 1983, ULTRAMICROSCOPY, V11, P262

[10] ZUR DEFOKUSSIERUNGSABHANGIGKEIT DES PHASENKONTRASTES BEI DER ELEKTRONENMIKROSKOPISCHEN ABBILDUNG [J].

THON, F .

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