A MODEL STUDY OF FIELD-DEPENDENT DYNAMICAL SCREENING DUE TO MOBILE ELECTRONS IN SUB-MICRON SEMICONDUCTOR-DEVICES

被引：25

作者：

LOWE, D

BARKER, JR

机构：

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1985年 / 18卷 / 12期

关键词：

D O I：

10.1088/0022-3719/18/12/013

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：2507 / 2525

页数：19

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