AUTOMATED INTERFEROGRAM ANALYSIS BASED ON AN INTEGRATED EXPERT-SYSTEM

被引:5
作者
JOO, WJ
CHA, SYS
机构
[1] Department of Mechanical Engineering, University of Illinois, Chicago, Chicago, IL, 60607, Mail Code 251
来源
APPLIED OPTICS | 1995年 / 34卷 / 32期
关键词
INTERFEROGRAM EVALUATION; FRINGE ANALYSIS; EXPERT SYSTEM;
D O I
10.1364/AO.34.007486
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Interferometric data, either from single-frame fringe-tracking and Fourier-transform techniques or from multiframe phase-shifting techniques, pose a problem of 2 pi ambiguity, that is, wrapped-phase information. As the degree of noise level increases, especially in high-speed aerodynamics, these techniques encounter difficulties in phase extraction to provide continuous unwrapped-phase information. Here, a new hybrid approach, called the integrated expert system, which is developed primarily for aerodynamic interferogram evaluation, is presented. The integrated expert system utilizes interferometric-specific knowledge rules to compensate for the limitations associated with conventional techniques. It integrates in a single structure an expert system and algorithmic programming to provide, as much as possible, a unified approach for all the interferogram evaluation techniques. This initial attempt may provide a useful groundwork for future development in intelligent interferogram processing. (C) 1995 Optical Society of America
引用
收藏
页码:7486 / 7496
页数:11
相关论文
共 15 条
[1]   DIGITAL FRINGE REDUCTION TECHNIQUES APPLIED TO THE MEASUREMENT OF 3-DIMENSIONAL TRANSONIC FLOW-FIELDS [J].
BECKER, F ;
YU, YH .
OPTICAL ENGINEERING, 1985, 24 (03) :429-434
[2]  
Choudry A., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V816, P49, DOI 10.1117/12.941755
[3]  
DENOFSKY ME, 1976, MITAI334 ART INT LAB
[4]  
GIARRATANO JC, 1989, EXPERT SYSTEM PRINCI
[5]  
Gierloff J. J., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V818, P2
[6]   COMPUTER-AIDED EVALUATION OF FRINGE PATTERNS [J].
KREIS, TM .
OPTICS AND LASERS IN ENGINEERING, 1993, 19 (4-5) :221-240
[7]   A MODULAR COMPUTER VISION SYSTEM FOR PICTURE SEGMENTATION AND INTERPRETATION [J].
LEVINE, MD ;
SHAHEEN, SI .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1981, 3 (05) :540-556
[8]   THE ARTIFICIAL-INTELLIGENCE APPROACH TO PATTERN-RECOGNITION - A PERSPECTIVE AND AN OVERVIEW [J].
NANDHAKUMAR, N ;
AGGARWAL, JK .
PATTERN RECOGNITION, 1985, 18 (06) :383-389
[9]  
Pryputniewicz R. J., 1989, P SOC PHOTO-OPT INS, V1162, P456
[10]  
REID GT, 1987, OPT LASER ENG, V7, P37