MULTILAYERS FOR HIGH HEAT LOAD SYNCHROTRON APPLICATIONS

被引:52
作者
ZIEGLER, E
机构
关键词
HIGH HEAT FLUX; MULTILAYERS; X RAYS; COATINGS;
D O I
10.1117/12.194837
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Multilayers are the optical elements of choice in any situation where flux rather than resolution is desired. They can be tailored to optimize either reflectivity at fixed or variable energy, or heat resistance, or bandpass, or harmonic rejection. The present state of the art of x-ray multilayers is presented, and the possible applications are reviewed, including the use of multilayers as soft x-ray polarizers, large-passband elements for hard x-rays, and power filters. In the situation of very intense beams the increase of temperature can produce significant changes of reflectivity, which have been extensively studied at the microstructure level in some cases, such as W/C, W/Si, and Mo/Si. Existing and prospective solutions are detailed, including heat treatment prior to x-ray exposure, use of compound materials, efficient cooling, and modification of the electric field distribution by nonperiodic arrangements.
引用
收藏
页码:445 / 452
页数:8
相关论文
共 88 条
[51]   CRYOGENIC COOLING OF MONOCHROMATORS [J].
MAROT, G ;
ROSSAT, M ;
FREUND, A ;
JOKSCH, S ;
KAWATA, H ;
ZHANG, L ;
ZIEGLER, E ;
BERMAN, L ;
CHAPMAN, D ;
HASTINGS, JB ;
IAROCCI, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :477-480
[52]  
NG W, 1992, REV SCI INSTRUM, V63, P619
[53]  
NGUYEN TD, 1993, EVOLUTION SURFACE TH, V280, P161
[54]  
PEDULLA J, 1993, P SOC PHOTO-OPT INS, V2011, P299
[55]   POWDER DIFFRACTION IN THE RANGE OF MILLISECONDS [J].
PENNARTZ, PU ;
LOCHNER, U ;
FUESS, H ;
WROBLEWSKI, T .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 (pt 5) :571-577
[56]  
Pianetta P., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P393
[57]   2 HIGH BRILLIANCE BEAM LINES AT THE ESRF DEDICATED TO MICRODIFFRACTION, BIOLOGICAL CRYSTALLOGRAPHY, AND SMALL-ANGLE SCATTERING (INVITED) [J].
RIEKEL, C ;
BOSECKE, P ;
DELRIO, MS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :974-981
[58]   COMPUTER-SEARCH FOR LAYER MATERIALS THAT MAXIMIZE THE REFLECTIVITY OF X-RAY MULTILAYERS [J].
ROSENBLUTH, AE .
REVUE DE PHYSIQUE APPLIQUEE, 1988, 23 (10) :1599-1621
[59]  
SALASHCHENKO NN, 1993, P SOC PHOTO-OPT INS, V2011, P402
[60]  
SCHAEFERS F, 1988, P SOC PHOTO-OPT INS, V984, P23