BEYOND THE CONVENTIONAL INFORMATION LIMIT - THE RELEVANT COHERENCE FUNCTION

被引:67
作者
NELLIST, PD
RODENBURG, JM
机构
[1] Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, Madingley Road
关键词
D O I
10.1016/0304-3991(94)90092-2
中图分类号
TH742 [显微镜];
学科分类号
摘要
The theory of partial coherence functions as applied to a super-resolution reconstruction algorithm is developed in detail, taking into account the phase gradients across the aperture function, the source and detector sizes, and temporal coherence. Experimental examples demonstrate the main properties of the relevant coherence envelopes, and why they need not limit the total band-pass of the microscope. It is demonstrated that finite detector size in the STEM configuration can facilitate a simpler reconstruction algorithm by creating a virtual objective aperture which obviates the need for a physical objective aperture. These results are also relevant to the question of uniquely deconvolving shadow images.
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收藏
页码:61 / 74
页数:14
相关论文
共 27 条
[1]   SUB-ANGSTROM TRANSMISSION MICROSCOPY - A FOURIER-TRANSFORM ALGORITHM FOR MICRODIFFRACTION PLANE INTENSITY INFORMATION [J].
BATES, RHT ;
RODENBURG, JM .
ULTRAMICROSCOPY, 1989, 31 (03) :303-308
[2]   COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION AND SHADOW IMAGING [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1979, 4 (04) :435-450
[3]   FRESNEL DIFFRACTION IN A COHERENT CONVERGENT ELECTRON-BEAM [J].
COWLEY, JM ;
DISKO, MM .
ULTRAMICROSCOPY, 1980, 5 (04) :469-477
[4]   COHERENT INTERFERENCE EFFECTS IN SIEM AND CBED [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1981, 7 (01) :19-26
[5]   SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1976, 2 (01) :3-16
[6]   IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J].
COWLEY, JM .
APPLIED PHYSICS LETTERS, 1969, 15 (02) :58-&
[7]   ATOMIC RESOLUTION IN LENSLESS LOW-ENERGY ELECTRON HOLOGRAPHY [J].
FINK, HW ;
SCHMID, H ;
KREUZER, HJ ;
WIERZBICKI, A .
PHYSICAL REVIEW LETTERS, 1991, 67 (12) :1543-1546
[8]  
FRANK J, 1976, 6TH P EUR C EL MICR, V1, P97
[9]   OPTICAL DEMONSTRATION OF A NEW PRINCIPLE OF FAR-FIELD MICROSCOPY [J].
FRIEDMAN, SL ;
RODENBURG, JM .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1992, 25 (02) :147-154
[10]   CONTRAST TRANSFER OF CRYSTAL IMAGES IN TEM [J].
ISHIZUKA, K .
ULTRAMICROSCOPY, 1980, 5 (01) :55-65