DESIGN AND PERFORMANCE OF A REFLECTRON BASED TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETER WITH ELECTRODYNAMIC PRIMARY ION MASS SEPARATION

[1] Mamyrin B. A., 1973, Soviet Physics - JETP, V37, P45

[2] NIEHUIS E, 1986, SPRINGER P PHYSICS, V9, P198

[3] Poschenrieder W. P., 1972, International Journal of Mass Spectrometry and Ion Physics, V9, P357, DOI 10.1016/0020-7381(72)80020-2

[4] ION OPTICS FOR TIME-OF-FLIGHT MASS SPECTROMETERS WITH MULTIPLE SYMMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 63 (2-3): : 273 - 287

[5] A TIME-OF-FLIGHT MASS-SPECTROMETER FOR STATIC SIMS APPLICATIONS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1322 - 1325

[1] Mamyrin B. A., 1973, Soviet Physics - JETP, V37, P45

[2] NIEHUIS E, 1986, SPRINGER P PHYSICS, V9, P198

[3] Poschenrieder W. P., 1972, International Journal of Mass Spectrometry and Ion Physics, V9, P357, DOI 10.1016/0020-7381(72)80020-2

[4] ION OPTICS FOR TIME-OF-FLIGHT MASS SPECTROMETERS WITH MULTIPLE SYMMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 63 (2-3): : 273 - 287

[5] A TIME-OF-FLIGHT MASS-SPECTROMETER FOR STATIC SIMS APPLICATIONS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1322 - 1325