A TIME-OF-FLIGHT MASS-SPECTROMETER FOR STATIC SIMS APPLICATIONS

被引：90

作者：

STEFFENS, P

NIEHUIS, E

FRIESE, T

GREIFENDORF, D

BENNINGHOVEN, A

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期

关键词：

D O I：

10.1116/1.573058

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1322 / 1325

页数：4

共 12 条

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[2] SECONDARY ION MASS-SPECTROMETRY OF BIOMOLECULES IN THE PICO-MOL AND FEMTO-MOL RANGE
BENNINGHOVEN, A
NIEHUIS, E
FRIESE, T
GREIFENDORF, D
STEFFENS, P
[J]. ORGANIC MASS SPECTROMETRY, 1984, 19 (07): : 346 - 346
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[4] A TIME-OF-FLIGHT MASS-SPECTROMETER FOR MEASUREMENT OF SECONDARY ION MASS-SPECTRA
CHAIT, BT
STANDING, KG
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 40 (02): : 185 - 193
[5] FRIESE T, 1982, THESIS MUENSTER
[6] PROPOSED METHOD FOR PRODUCING SHORT INTENSE MONOENERGETIC ION PULSES
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[J]. PHYSICAL REVIEW, 1952, 88 (02): : 360 - 361
[7] NIEHUIS E, 1981, THESIS MUENSTER
[8] FOCUSING ERRORS OF A MULTIPLE-FOCUSING TIME-OF-FLIGHT MASS-SPECTROMETER WITH AN ELECTROSTATIC SECTOR FIELD
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[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 16 (04): : 353 - 367
[9] OETJEN GH, 1974, IPP915 REP
[10] Poschenrieder W. P., 1972, International Journal of Mass Spectrometry and Ion Physics, V9, P357, DOI 10.1016/0020-7381(72)80020-2