THRESHOLD IONIZATION-ENERGY OF C-60 IN THE SOLID-STATE

被引：53

作者：

SATO, N

SAITO, Y

SHINOHARA, H

机构：

[1] MIE UNIV,FAC ENGN,DEPT ELECT ENGN,TSU,MIE 514,JAPAN

[2] MIE UNIV,FAC ENGN,DEPT CHEM MAT,TSU,MIE 514,JAPAN

来源：

CHEMICAL PHYSICS | 1992年 / 162卷 / 2-3期

关键词：

D O I：

10.1016/0301-0104(92)85020-U

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The threshold ionization energy of C60 vacuum-deposited thin films was determined to be 6.17 +/- 0.07 eV by ultraviolet photoemission spectroscopy with low photon-energy excitations and retarding-field analysis of photoemitted electrons. This method also enabled to determine the work function to be 4.85 +/- 0.05 eV. The obtained values can be compared with the values reported so far and are discussed in terms of energetic relaxation of a C60 molecule via condensation to the solid state.

引用

页码：433 / 438

页数：6

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