OXYGEN PRECIPITATION EFFECTS ON SI-N+-P JUNCTION LEAKAGE BEHAVIOR

[1] CHYE P, COMMUNICATION

[2] ALPHA-PARTICLE-INDUCED SOFT ERRORS IN DYNAMIC MEMORIES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) : 2 - 9

[3] OGINO M, 1980, FAL EL SOC M HOLLYW, V80

[4] Pearce C.W., 1977, SEMICONDUCTOR SILICO, P606

[5] PEARCE CW, 1981, SEMICONDUCTOR SILICO, P713

[6] ROZGONYI GT, 1978, APPL PHYS LETT, V32, P1

[7] NUCLEATION OF STACKING-FAULTS AT OXIDE PRECIPITATE-DISLOCATION COMPLEXES IN SILICON [J]. APPLIED PHYSICS LETTERS, 1976, 29 (12) : 765 - 767

[8] 1977, ANN BOOK ASTM STANDA

[1] CHYE P, COMMUNICATION

[2] ALPHA-PARTICLE-INDUCED SOFT ERRORS IN DYNAMIC MEMORIES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) : 2 - 9

[3] OGINO M, 1980, FAL EL SOC M HOLLYW, V80

[4] Pearce C.W., 1977, SEMICONDUCTOR SILICO, P606

[5] PEARCE CW, 1981, SEMICONDUCTOR SILICO, P713

[6] ROZGONYI GT, 1978, APPL PHYS LETT, V32, P1

[7] NUCLEATION OF STACKING-FAULTS AT OXIDE PRECIPITATE-DISLOCATION COMPLEXES IN SILICON [J]. APPLIED PHYSICS LETTERS, 1976, 29 (12) : 765 - 767

[8] 1977, ANN BOOK ASTM STANDA