PEAK POSITION DETERMINATION OF X-RAY-DIFFRACTION PROFILES IN PRECISION LATTICE-PARAMETER MEASUREMENTS ACCORDING TO THE BOND-METHOD WITH HELP OF THE POLYNOMIAL-APPROXIMATION

被引:8
作者
GROSSWIG, S
JACKEL, KH
KITTNER, R
机构
关键词
D O I
10.1002/crat.2170210132
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:133 / 139
页数:7
相关论文
共 20 条
[1]  
BAKER TW, 1969, AERE R5152 AT EN RES
[2]  
Baker TW, 1968, ADVANCES XRAY ANALYS, V11, P359
[3]   X-RAY WAVELENGTHS [J].
BEARDEN, JA .
REVIEWS OF MODERN PHYSICS, 1967, 39 (01) :78-&
[4]  
BERGER H, 1984, 18 JAHR TAG VFK BERL
[5]   PRECISION LATTICE CONSTANT DETERMINATION [J].
BOND, WL .
ACTA CRYSTALLOGRAPHICA, 1960, 13 (10) :814-818
[6]   EFFECT OF CRYSTAL PERFECTION AND POLARITY ON ABSORPTION EDGES SEEN IN BRAGG DIFFRACTION [J].
COLE, H ;
STEMPLE, NR .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) :2227-&
[7]   X-RAY TO VISIBLE WAVELENGTH RATIOS [J].
DESLATTES, RD ;
HENINS, A .
PHYSICAL REVIEW LETTERS, 1973, 31 (16) :972-975
[8]   GENERATION AND USE OF ORTHOGONAL POLYNOMIALS FOR DATA-FITTING WITH A DIGITAL COMPUTER [J].
FORSYTHE, GE .
JOURNAL OF THE SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, 1957, 5 (02) :74-88
[9]  
GALDECKA E, 1984, ACTA CRYSTALLOGR A, V40, pC430
[10]   PRECISION LATTICE-PARAMETER DETERMINATION OF COLORED QUARTZ MONOCRYSTALS [J].
GROSSWIG, S ;
HARTWIG, J ;
ALTER, U ;
CHRISTOPH, A .
CRYSTAL RESEARCH AND TECHNOLOGY, 1983, 18 (04) :501-511