A MODEL FOR CALCULATING SECONDARY AND BACKSCATTERED ELECTRON YIELDS

[1] ELECTRON BACKSCATTERING FROM BULK MATERIALS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (01) : 526 - 534

[2] BETHE H, 1930, ANN PHYS, V5, P235

[3] BISHOP HE, 1979, NBS SPECIAL PUBLICAT, V460, P5

[4] RESOLUTION LIMITS IN SURFACE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG): : 417 - 435

[5] SIMPLE CALCULATION OF ENERGY-DISTRIBUTION OF LOW-ENERGY SECONDARY ELECTRONS EMITTED FROM METALS UNDER ELECTRON-BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) : 707 - 709

[6] RESPONSE OF SI AND GAP P-N JUNCTIONS TO A 5- TO 40-KEV ELECTRON BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (11) : 4236 - &

[7] DEKKER AJ, 1958, SOLID STATE PHYS, V6, P251

[8] DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331

[9] A COMPARISON OF ELECTRON-TRANSPORT IN AES PES WITH NEUTRON-TRANSPORT THEORY [J]. SURFACE SCIENCE, 1985, 152 (APR) : 884 - 894

[10] JONKER JLH, 1952, PHILIPS RES REP, V7, P1

[1] ELECTRON BACKSCATTERING FROM BULK MATERIALS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (01) : 526 - 534

[2] BETHE H, 1930, ANN PHYS, V5, P235

[3] BISHOP HE, 1979, NBS SPECIAL PUBLICAT, V460, P5

[4] RESOLUTION LIMITS IN SURFACE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG): : 417 - 435

[5] SIMPLE CALCULATION OF ENERGY-DISTRIBUTION OF LOW-ENERGY SECONDARY ELECTRONS EMITTED FROM METALS UNDER ELECTRON-BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) : 707 - 709

[6] RESPONSE OF SI AND GAP P-N JUNCTIONS TO A 5- TO 40-KEV ELECTRON BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (11) : 4236 - &

[7] DEKKER AJ, 1958, SOLID STATE PHYS, V6, P251

[8] DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331

[9] A COMPARISON OF ELECTRON-TRANSPORT IN AES PES WITH NEUTRON-TRANSPORT THEORY [J]. SURFACE SCIENCE, 1985, 152 (APR) : 884 - 894

[10] JONKER JLH, 1952, PHILIPS RES REP, V7, P1